Probe materials

Under the current situation where precious metals are used as materials for probes used in inspecting the electric properties of semiconductor circuits, we provide probe material products that meet a variety of different needs.

TY series and Ag-Pd-Cu-based alloys

Features

This series includes precipitation-hardened materials that excel in contact reliability and wear and corrosion resistance, exhibit excellent mechanical properties such as spring characteristics and hardness, and provide high degree of hardness by heat treatment. You can increase hardness by heat treatment after cutting and shaping. The TY series offers choices from lines of Au- and Pd-based materials.

Physical properties of probe materials (reference)

Melting point (℃) Density (g/cm3) Hardness (HV) Tensile strength (MPa) Young's modulus (GPa) Volume resistivity (μΩ・cm)
TY80N 1050 10.5 290~420 1000~1300 115~125 18~23
TY90 1050 10.5 290~440 1000~1300 115~125 16~23
TY100 1085 11.8 290~370 1000~1400 120~125 30~35
TY110 1050 10.4 290~460 1000~1400 110~120 14~23
TY200 960 16.2 250~330 900~1100 110~120 15~21
TY300 950 15.4 270~340 1000~1400 110~120 13~22
40Ag-Pd-Cu 1050 10.7 290~420 1000~1450 110~120 15~22
35Ag-Pd-Cu 1050 10.4 290~400 1000~1200 110~120 11~18
30Ag-Pd-Cu 1050 10.5 290~450 1000~1450 115~125 11~22

For information about materials not listed here, please contact us.

SEM image of Ag-Pd-Cu based probe material

pagetop